Title :
A compact SPICE model of EEPROM cell studying the pulse ramp effect during erase operations
Author :
Benzerti, W. ; Bouchakour, R. ; Seon, J.K. ; Mirabel, J.M. ; Boivin, Ph
Author_Institution :
Ecole Nat. Superieure des Telecommun., Paris, France
Abstract :
This paper presents a compact SPICE model of an EEPROM cell. It is dedicated to the simulation of write/erase operations occurring in transient regime. Attention is focused on the effect of the variation of the pulse ramping on erase operations
Keywords :
EPROM; SPICE; equivalent circuits; DC analysis; EEPROM cell; compact SPICE model; effective threshold voltage variation; equivalent circuit; erase operations; floating gate MOST; pulse ramp effect; transient regime; tunnel current evolution; Capacitance; Circuits; EPROM; MOSFETs; Nonvolatile memory; Production; Random access memory; SPICE; Statistics; Voltage;
Conference_Titel :
Circuits and Systems, 1999. 42nd Midwest Symposium on
Conference_Location :
Las Cruces, NM
Print_ISBN :
0-7803-5491-5
DOI :
10.1109/MWSCAS.1999.867832
