Title :
A scaleable waferscale architecture for real-time 3-D image generation
Author_Institution :
Nat. Semicond., Santa Clara, CA, USA
Abstract :
A wafer-scale architecture for the real-time generation of shaded, full-color perspective images of complex three-dimensional scenes is described, The system is capable of operating at the high pixel rates required to produce scenes in real time on high-resolution screens with high refresh rates. This image generation architecture meets the requirements of Catt´s fault tolerant approach to wafer-scale integration circuits
Keywords :
VLSI; computer architecture; computerised picture processing; fault tolerant computing; real-time systems; Catt´s fault tolerant approach; complex three-dimensional scenes; full-color perspective images; high-resolution screens; image generation; pixel rates; real-time; refresh rates; scaleable waferscale architecture; Application software; Circuits; Computational modeling; Computer architecture; Fault tolerance; Image generation; Layout; Manufacturing processes; Real time systems; Switches;
Conference_Titel :
Wafer Scale Integration, 1989. Proceedings., [1st] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9901-9
DOI :
10.1109/WAFER.1989.47540
