DocumentCode :
2407312
Title :
Thin film head characteristics studied by inductance change from bias current control
Author :
Kawakami, K. ; Ohtu, T. ; Homma, H.
Author_Institution :
Hitachi, Ltd.
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
8
Lastpage :
8
Keywords :
Current control; Current measurement; Electric current control; Impedance measurement; Inductance measurement; Low pass filters; Magnetic heads; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696191
Filename :
696191
Link To Document :
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