Title :
Thin film head characteristics studied by inductance change from bias current control
Author :
Kawakami, K. ; Ohtu, T. ; Homma, H.
Author_Institution :
Hitachi, Ltd.
Keywords :
Current control; Current measurement; Electric current control; Impedance measurement; Inductance measurement; Low pass filters; Magnetic heads; Temperature; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696191