DocumentCode
2407578
Title
Test solution for OTA based analog circuits
Author
Ray, Baidya Nath ; Nandi, P.P. ; Nandi, P.K.
Author_Institution
Electron. & Tele-Commun. Eng. Dept., Bengal Eng. Coll., Howrah, India
fYear
2002
fDate
2002
Firstpage
773
Lastpage
778
Abstract
This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology is proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution
Keywords
analogue integrated circuits; cellular automata; fault diagnosis; integrated circuit testing; operational amplifiers; OTA based analog circuits; cellular automata based classifier; compressed signature generation; diagnosis methodology; multiple performance parameters; test methodology; Analog circuits; Circuit faults; Circuit testing; Computer science; Educational institutions; Fault diagnosis; Filters; Frequency; System testing; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.
Conference_Location
Bangalore
Print_ISBN
0-7695-1441-3
Type
conf
DOI
10.1109/ASPDAC.2002.995027
Filename
995027
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