DocumentCode :
2408182
Title :
SSC-a tool for the synthesis of testable sequential machines
Author :
Makki, R.Z. ; Muha, J. ; Boughazal, S. ; Kaylani, T.
Author_Institution :
North Carolina Univ., Charlotte, NC, USA
fYear :
1990
fDate :
Feb. 26 1990-March 2 1990
Firstpage :
455
Lastpage :
461
Abstract :
A new CAD system, called SSC, is presented for the design and test of finite-state machines (FSMs). SSC utilizes a controlled design environment to simplify the logic synthesis and verification process. SSC utilizes a high-level structured input description where the state sequencing information is implicit in the specification. It is demonstrated that synthesis for testability and test generation depend on the type of state assignment adopted. SSC offers flexibility of choice in the synthesis of FSMs. It is shown that this flexibility is important because each of the state assignment options in SSC is tailored for a specific FSM structure. This enhances the performance of the final product as measured by silicon area, speed, and testability.<>
Keywords :
finite automata; logic CAD; logic testing; CAD system; SSC; finite-state machines; state assignment; test generation; testability; testable sequential machines; Automata; Automatic test pattern generation; Circuit faults; Control systems; Design for testability; Encoding; Minimization; Sequential analysis; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compcon Spring '90. Intellectual Leverage. Digest of Papers. Thirty-Fifth IEEE Computer Society International Conference.
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-2028-5
Type :
conf
DOI :
10.1109/CMPCON.1990.63723
Filename :
63723
Link To Document :
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