Title :
Thermal noise limits in nanoscale electronics
Author :
Mudrow, M. ; Wanalertlak, W. ; Forbes, L.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
Abstract :
An analysis of thermal noise predicts the number of bit errors per year caused by noise in nanoscale electronic memories and processors will be excessive. Noise it seems has already imposed a fundamental limit on the speed of microprocessors. No significant advance in microprocessor speeds is anticipated due not only to power limitations but also noise limits
Keywords :
error statistics; integrated circuit noise; integrated memory circuits; logic testing; microprocessor chips; nanoelectronics; bit error rates; logic error rates; memory error rates; microprocessor speeds; nanoscale electronic memories; nanoscale electronic processors; thermal noise limits; Bit error rate; CMOS logic circuits; Circuit noise; Error analysis; Logic circuits; Microprocessors; Noise level; Thermal resistance; Threshold voltage; Tunneling;
Conference_Titel :
Microelectronics and Electron Devices, 2006. WMED '06. 2006 IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
1-4244-0374-X
DOI :
10.1109/WMED.2006.1678299
