Title :
Introduction to modeling an imaging system with human detection of artifacts
Author :
Sukumar, Vinesh ; Warner, Doug ; Doherty, Patrick ; Hess, Herbert ; Noren, Ken ; Krone, Steve
Author_Institution :
Micron Technol. Inc., Boise, ID
Abstract :
This paper introduces a mathematical model to help identify defects for any imaging system. These defects become detectable when the combined information presented by an imaging system exceeds the perception threshold of a human visual system. These models are being developed under certain simplifying assumptions which are presented in the course of the paper
Keywords :
CMOS image sensors; integrated circuit modelling; integrated circuit noise; CMOS image sensor; defect modeling; human detection; human visual system; imaging system modeling; Humans; Image processing; Image quality; Mathematical model; Optical imaging; Optical noise; Optical sensors; Optical signal processing; Semiconductor device modeling; Visual system;
Conference_Titel :
Microelectronics and Electron Devices, 2006. WMED '06. 2006 IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
1-4244-0374-X
DOI :
10.1109/WMED.2006.1678305
