• DocumentCode
    2408859
  • Title

    ESR and ESL of ceramic capacitor applied to decoupling applications

  • Author

    Roy, Taninoy ; Smith, Larry ; Prymak, John

  • Author_Institution
    Sun Microsyst. Inc., Palo Alto, CA, USA
  • fYear
    1998
  • fDate
    26-28 Oct 1998
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    Power distribution system noise affects computer product timing performance, signal integrity and electromagnetic interference. Between 1 MHz and 1 GHz, the primary means of reducing power distribution noise is with ceramic decoupling capacitors. To achieve a certain target impedance, it is important to characterize the ESR of ceramic decoupling capacitors, as this directly determines the number of capacitors required on a board. A new technique to extract ESR is described in this paper. Another factor which determines the capacitance value of decoupling capacitors is the ESL (equivalent series inductance) associated with capacitors mounted on a PCB. A study that compares the ESL of different pad layout geometries is also presented
  • Keywords
    capacitance; ceramic capacitors; circuit noise; electric resistance; electromagnetic interference; inductance; packaging; printed circuit layout; printed circuit testing; timing; 1 MHz to 1 GHz; ESL; ESR; ESR extraction method; PCB-mounted capacitors; capacitance; ceramic capacitor; ceramic decoupling capacitors; computer product timing performance; decoupling applications; decoupling capacitors; electromagnetic interference; equivalent series inductance; equivalent series resistance; pad layout geometries; power distribution noise; power distribution system noise; signal integrity; target impedance; Application software; Capacitors; Ceramics; Distributed computing; Electromagnetic interference; Impedance; Noise reduction; Paramagnetic resonance; Power distribution; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
  • Conference_Location
    West Point, NY
  • Print_ISBN
    0-7803-4965-2
  • Type

    conf

  • DOI
    10.1109/EPEP.1998.733985
  • Filename
    733985