• DocumentCode
    2408945
  • Title

    Stress distribution of thin circular quartz qafer and force sensitive characteristic experiments of resonator

  • Author

    Luo, Bing ; Tian, Wenjie ; Zou, Shufang

  • Author_Institution
    Res. Centre of Sensor Technol., Beijing Inf. Sci. & Technol. Univ., Beijing, China
  • fYear
    2009
  • fDate
    15-16 May 2009
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    An ANSYS analysis and computation of the stress distribution in circular AT cut quartz wafer was carried out, when quartz wafer was subjected to a force along its diameter which was parallel to the x axis, the force-frequency coefficient of quartz resonator were tested by using plated electrode on different region. Experiment proves that the result of ANSYS analysis is nearly consistent with experiment, and the maximum error is 0.36%. Therefore, when a resonator is designed on the same circular quartz, by using the finite element method, electrode may be set at the limited scope to choose positions of the notable force-frequency coefficient according to the stress distribution of the wafer. The integrated quartz resonator of the prominent force-frequency coefficient can be obtained.
  • Keywords
    crystal resonators; finite element analysis; finite element method; force sensitive characteristic; force-frequency coefficient; quartz resonator; stress distribution; thin circular quartz wafer; Azimuth; Force measurement; Force sensors; Frequency conversion; Frequency measurement; Pressure measurement; Resonant frequency; Sensor phenomena and characterization; Strain measurement; Stress measurement; ANSYS analysis; force-frequency; quartz crystal; resonator; sensitivity coefficient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Mechatronics and Automation, 2009. ICIMA 2009. International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-3817-4
  • Type

    conf

  • DOI
    10.1109/ICIMA.2009.5156627
  • Filename
    5156627