Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure

Author

Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, D. ; Pouget, V. ; Fouillat, P. ; Essely, F. ; Perdu, P.

Author_Institution

STMicroelectronics, Rousset

fYear

2008

fDate

7-11 July 2008

Firstpage

1

Lastpage

5

Abstract

Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve accuracy of fault isolation and defect localization.

Keywords

VLSI; automatic test pattern generation; logic testing; VLSI circuits; complexity; defect isolation; defect localization; fault isolation; functional logic failure; laser stimulation; optical techniques; scan-based ATPG diagnostic; Automatic test pattern generation; Circuit faults; Circuit testing; Failure analysis; Flip-flops; Laboratories; Logic circuits; Logic devices; Logic testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the

Conference_Location

Singapore

Print_ISBN

978-1-4244-2039-1

Electronic_ISBN

978-1-4244-2040-7

Type

conf

DOI

10.1109/IPFA.2008.4588145

Filename

4588145