Title :
Application of FIB circuit edit combined with TIVA in advanced failure analysis
Author :
Zhu, David ; Neo, S.P. ; Loh, S.K. ; Er, Eddie
Author_Institution :
Failure Anal. Group, Chartered Semicond. Manuf. Ltd., Singapore
Abstract :
This paper presented a failure analysis methodology to overcome the difficulties of fault location encountered by pin leakage and some testing parameter failures in a mixed signal device. These types of failure generally cannot be solved by traditional electrical failure analysis methods.
Keywords :
failure analysis; fault location; focused ion beam technology; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; FIB circuit edit; TIVA; advanced failure analysis; fault location; mixed signal device; pin leakage; thermal induced voltage altering; Circuit faults; Circuit testing; Failure analysis; Fault diagnosis; Ion beams; Laser beams; Laser transitions; Pins; Silicon on insulator technology; Voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2039-1
Electronic_ISBN :
978-1-4244-2040-7
DOI :
10.1109/IPFA.2008.4588147
