Title :
Characteristics of coplanar waveguide on sapphire for high temperature applications (25 to 400° C)
Author :
Ponchak, George E. ; Jordan, Jennifer L. ; Scardelletti, Maximilian ; Stalker, Amy R.
Author_Institution :
NASA Glenn Res. Center, Cleveland
Abstract :
This paper presents the characteristics of coplanar waveguide transmission lines fabricated on R-plane sapphire substrates as a function of temperature across the temperature range of 25 to 400degC. Effective permittivity and attenuation are measured on a high temperature probe station. Two techniques are used to obtain the transmission line characteristics, a Thru-Reflect-Line calibration technique that yields the propagation coefficient and resonant stubs. To a first order fit of the data, the effective permittivity and the attenuation increase linearly with temperature.
Keywords :
attenuation measurement; coplanar transmission lines; coplanar waveguides; permittivity measurement; sapphire; R-plane sapphire substrates; coplanar waveguide transmission lines; high temperature applications; high temperature probe station; temperature 25 C to 400 C; thru-reflect-line calibration technique; Attenuation; Calibration; Circuits; Coplanar waveguides; Gallium nitride; Permittivity measurement; Silicon carbide; Substrates; Temperature distribution; Temperature sensors;
Conference_Titel :
Microwave Conference, 2007. European
Conference_Location :
Munich
Print_ISBN :
978-2-87487-001-9
DOI :
10.1109/EUMC.2007.4405345