DocumentCode :
2409074
Title :
Circuit and platform design challenges in technologies beyond 90nm
Author :
Grundmann, Bill ; Galivanche, Rajesh ; Kundu, Sandip
Author_Institution :
Dept. of Design Technol., Intel Corp., Hillsboro, OR, USA
fYear :
2003
fDate :
2003
Firstpage :
44
Lastpage :
47
Abstract :
There are already a huge number of problems for silicon designers and it is likely to just get worse. Many of these problems are technical, associated with shrinking geometries and increasing architecture complexities, but there are a significant number that seem to be caused by procedurally related mistakes and issues. Many of the technical problems are solved and re-solved on a piecemeal basis, focusing on local optimizations of small design-space problems. Unfortunately, many of these local solutions really create a less apparent but larger inefficiency in the whole design flow. The reason for this is that few ever look at the whole design methodology, especially as it applies to large design teams. As a consequence, this lack of oversight for the whole methodology is causing project procedural problems and inefficiencies.
Keywords :
design engineering; integrated circuit design; nanoelectronics; project engineering; 90 nm; architecture complexity increase; circuit design; design flow inefficiency; design methodology; large design teams; local optimizations; nanoelectronics; platform design; procedurally related mistakes; shrinking geometries; technical problem solution; Circuits; Costs; Design methodology; Design optimization; Geometry; History; Moore´s Law; Silicon; Terminology; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253585
Filename :
1253585
Link To Document :
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