DocumentCode :
2409159
Title :
Reduced delay uncertainty in high performance clock distribution networks
Author :
Velenis, Dimitrios ; Papaefthymiou, Marios C. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
fYear :
2003
fDate :
2003
Firstpage :
68
Lastpage :
73
Abstract :
The design of clock distribution networks in synchronous digital systems presents enormous challenges. Controlling the clock signal delay in the presence of various noise sources, process parameter variations, and environmental effects represents a fundamental problem in the design of high speed synchronous circuits. A polynomial time algorithm that improves the tolerance of a clock distribution network to process and environmental variations is presented in this paper. The algorithm generates a clock tree topology that minimizes the uncertainty of the clock signal delay to the most critical data paths. Strategies for enhancing the physical layout of the clock tree to decrease delay uncertainty are also presented. Application of the methodology on benchmark circuits demonstrates clock tree topologies with decreased delay uncertainties of up to 90%. Techniques to enhance a clock tree layout have been applied on a set of benchmark circuits, yielding a reduction in delay uncertainty of up to 48%.
Keywords :
circuit optimisation; clocks; delays; integrated circuit design; integrated circuit noise; logic design; logic simulation; network topology; clock distribution network tolerance; clock signal delay control; clock tree topology; delay uncertainty reduction; environmental effects; high performance clock distribution networks; high speed synchronous circuits; noise sources; polynomial time algorithm; process parameter variations; signal delay uncertainty minimization; synchronous digital systems; Circuit noise; Circuit topology; Clocks; Delay effects; Digital systems; Polynomials; Signal design; Signal processing; Uncertainty; Working environment noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253589
Filename :
1253589
Link To Document :
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