Title :
Noise macromodel for radio frequency integrated circuits
Author :
Xu, Yang ; Li, Xin ; Li, Peng ; Pileggi, Lawrence
Keywords :
Circuit noise; Circuit simulation; Integrated circuit noise; Mathematical model; Noise level; Noise reduction; Radio frequency; Radiofrequency integrated circuits; Semiconductor device noise; Time varying systems;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253601
