DocumentCode
2409410
Title
Noise macromodel for radio frequency integrated circuits
Author
Xu, Yang ; Li, Xin ; Li, Peng ; Pileggi, Lawrence
fYear
2003
fDate
2003
Firstpage
150
Lastpage
155
Keywords
Circuit noise; Circuit simulation; Integrated circuit noise; Mathematical model; Noise level; Noise reduction; Radio frequency; Radiofrequency integrated circuits; Semiconductor device noise; Time varying systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN
1530-1591
Print_ISBN
0-7695-1870-2
Type
conf
DOI
10.1109/DATE.2003.1253601
Filename
1253601
Link To Document