• DocumentCode
    2409609
  • Title

    EBIST: a novel test generator with built-in fault detection capability

  • Author

    Pradhan, Dhiraj K. ; Liu, Chunsheng ; Chakraborty, Krish

  • fYear
    2003
  • fDate
    2003
  • Firstpage
    224
  • Lastpage
    229
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; DH-HEMTs; Design methodology; Fault detection; Hardware; Logic testing; Manufacturing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253612
  • Filename
    1253612
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2409609