Title :
EBIST: a novel test generator with built-in fault detection capability
Author :
Pradhan, Dhiraj K. ; Liu, Chunsheng ; Chakraborty, Krish
Keywords :
Built-in self-test; Circuit faults; Circuit testing; DH-HEMTs; Design methodology; Fault detection; Hardware; Logic testing; Manufacturing; Test pattern generators;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253612
