DocumentCode :
2409849
Title :
Micromachined silicon conformal packaging for millimeter wave system applications
Author :
Katehi, Linda P B ; Kihm, R.T.
Author_Institution :
Raytheon Syst. Co., Michigan Univ., USA
fYear :
1998
fDate :
26-28 Oct 1998
Firstpage :
247
Abstract :
Summary form only given. Low RF loss, high density, yet affordable mm-wave system packaging combined with ever increasing MMIC device performance is set to unlock the long anticipated potential of many mm-wave systems operating in the 30-100 GHz spectral region. This paper discusses the merging of several complementary technologies that enable highly miniaturized mm-wave multi-function packages which are potentially capable of high rate and volume production: silicon RF micromachining, flip chip MMICs and PbSn solder MMIC attachment. The heart of this approach is the RF silicon micromachining technology developed at the University of Michigan. This development has led to the successful fabrication of numerous mm-wave building block components densely integrated in conformal Si packages that provide low RF loss with high isolation. The fabrication is based upon modified Si processing which has the potential for high volume batch production. Hard-bumped, flip chip MMIC attachment by lead-tin solder reflow provides repeatable and accurate chip self-alignment. Plated silver bumps 2 mils in diameter provide MMIC with low parasitic DC, RF and thermal interconnections. This flip chip attachment technique is suited to automated “pick, place and bond” equipment, thus contributing to the low cost mm-wave system implementation objective. Both simulated and measured micromachined component performance are presented as well as bump measured geometrical and mechanical characteristics
Keywords :
MIMIC; elemental semiconductors; flip-chip devices; integrated circuit interconnections; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; isolation technology; microassembling; micromachining; reflow soldering; silicon; 2 mil; 30 to 100 GHz; Ag; MMIC device performance; PbSn; PbSn solder MMIC attachment; RF loss; RF silicon micromachining technology; Si; automated pick/place/bond equipment; bump measured geometrical characteristics; bump measured mechanical characteristics; chip self-alignment; complementary technologies; conformal Si packages; flip chip MMICs; flip chip attachment technique; hard-bumped flip chip MMIC attachment; isolation; lead-tin solder reflow; low parasitic DC interconnections; low parasitic RF interconnections; low parasitic thermal interconnections; micromachined component performance; micromachined silicon conformal packaging; millimeter wave system applications; miniaturized mm-wave multi-function packages; mm-wave building block components; mm-wave system cost; mm-wave system implementation objective; mm-wave system packaging; mm-wave system packaging density; mm-wave systems; modified Si processing; plated silver bumps; silicon RF micromachining; simulated micromachined component performance; spectral region; volume batch production; volume production; Fabrication; Flip chip; MMICs; Mechanical variables measurement; Micromachining; Millimeter wave technology; Packaging; Production; Radio frequency; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 1998. IEEE 7th Topical Meeting on
Conference_Location :
West Point, NY
Print_ISBN :
0-7803-4965-2
Type :
conf
DOI :
10.1109/EPEP.1998.734034
Filename :
734034
Link To Document :
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