A method of test generation for path delay faults using stuck-at fault test generation algorithms

In this paper, we propose a test generation method for non-robust path delay faults using stuck-at fault test generation algorithms. In our method, we first transform an original combinational circuit into a circuit called a partial leaf-dag using a path-leaf transformation. Then we generate test patterns using a stuck-at fault test generation algorithm for stuck-at faults in the partial leaf-dag. Finally we transform the test patterns into two-pattern tests for path delay faults in the original circuit. We prove the correctness of the approach and experimental results on several benchmark circuits show the effectiveness of it.