Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
Abstract :
This paper evaluates the outlier sensitivity of five independent component analysis (ICA) algorithms (FastICA, extended-Infomax, JADE, radical, and β-divergence) using: (i) the Amari separation performance index, (ii) the optimum angle of rotation error, and (iii) the contrast function difference, in an outlier-contaminated mixture simulation. The Amari separation performance index has revealed a strong sensitivity of JADE and FastICA, using 3rd- and 4th- order nonlinearities, to outliers. However, the two contrast measures demonstrated conclusively that β-divergence is the least outlier-sensitive algorithm, followed by Radical, FastICA (exponential and hyperbolic-tangent nonlinearities), extended-Infomax, JADE, and FastICA (3rd-and 4th-order nonlinearities) in an outlier-contaminated mixture of two uniformly distributed signals. The novelty of this paper is the development of an unbiased optimization-landscape environment for assessing outlier sensitivity, as well as the optimum angle of rotation error and the contrast function difference as promising new measures for assessing the outlier sensitivity of ICA algorithms.
Keywords :
cognitive systems; higher order statistics; independent component analysis; optimisation; performance index; β-divergence algorithm; 3rd-order nonlinearities; 4th-order nonlinearities; Amari separation performance index; FastICA algorithm; JADE algorithm; cognitive informatics; contrast function difference; exponential nonlinearities; extended-Infomax algorithm; higher-order statistics; hyperbolic-tangent nonlinearities; optimum angle of rotation error; outlier sensitivity; outlier-contaminated mixture simulation; radical ICA algorithm; robust independent component analysis; robust statistics; unbiased optimization-landscape environment; Biomedical measurements; Brain modeling; Cognitive informatics; Electroencephalography; Independent component analysis; Performance analysis; Pollution measurement; Robustness; Signal processing algorithms; Statistical analysis;