Title :
The PCB defect inspection system design based on lab windows/CVI
Author :
Fen, Wang ; Xuemei, Li ; Gang, Xu
Author_Institution :
Sch. of Mechatron. & Control Eng., Shenzhen Univ., Shenzhen, China
Abstract :
A novel approach used for Printed Circuit Board (PCB) defect inspection is presented in this paper. This image processing approach that developed in Lab Windows/CVI can be used to determine whether PCB components are put in the correct location, and matches areas of inspection to a template of valid components. The experimental result shows that the proposed approach can search the correct components in PCB image with a given template, therefore it can be used in an automatic optical inspection for online inspection.
Keywords :
automatic optical inspection; flaw detection; image matching; printed circuit manufacture; printed circuit testing; virtual instrumentation; Lab Windows/CVI; PCB defect inspection system design; PCB image matching; automatic optical inspection; image processing; online inspection; Automatic control; Automatic optical inspection; Histograms; Image processing; Manufacturing industries; Manufacturing processes; Mechatronics; Pattern matching; Printed circuits; Production; LabWindows/CVI; PCB; defect; image; inspection; pattern matching;
Conference_Titel :
Industrial Mechatronics and Automation, 2009. ICIMA 2009. International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-3817-4
DOI :
10.1109/ICIMA.2009.5156669
