DocumentCode :
2410155
Title :
A multimodal sensing device for fluorescence imaging and electrical potential measurement of neural activities in a mouse deep brain
Author :
Ohta, Jun ; Tagawa, Ayato ; Minami, Hiroki ; Noda, Toshihiko ; Sasagawa, Kiyotaka ; Tokuda, Takashi ; Hatanaka, Yumiko ; Ishikawa, Yasuyuki ; Tamura, Hideki ; Shiosaka, Sadao
Author_Institution :
CREST, Nara Inst. of Sci. & Technol., Ikoma, Japan
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
5887
Lastpage :
5890
Abstract :
We have developed a multimodal CMOS sensing device to detect fluorescence image and electrical potential for neural activities in a mouse deep brain. The device consists of CMOS image sensor with on-chip electrodes and excitation light sources, all of which are integrated on a polyimide substrate. The novel feature of this device is its embedded on-chip electrodes which are partially transmit incident light so that the whole image can be acquired by the sensor. We have demonstrated the CMOS sensor device successfully operates in hippocampus area of an anesthetized mouse.
Keywords :
CMOS image sensors; bioelectric potentials; biomedical electrodes; biomedical measurement; biomedical optical imaging; brain; fluorescence; lab-on-a-chip; light sources; neurophysiology; anesthetized mouse; electrical potential measurement; embedded on-chip electrodes; fluorescence imaging; hippocampus area; incident light transmission; light source excitation; mouse deep brain; multimodal CMOS image sensing device; multimodal sensing device; neural activities; polyimide substrate; Action Potentials; Animals; Brain; Electrodes, Implanted; Electroencephalography; Equipment Design; Equipment Failure Analysis; Lighting; Mice; Microscopy, Fluorescence; Miniaturization; Neurons; Reproducibility of Results; Semiconductors; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Systems Integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5334461
Filename :
5334461
Link To Document :
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