Title :
Understanding Soft Defect Localization set-points for reducing cause-not-founds in integrated circuits
Author :
Ravikumar, V.K. ; Phoa, S.L. ; Narang, V. ; Chin, J.M.
Author_Institution :
Adv. Micro Devices Singapore Pte Ltd., Singapore
Abstract :
Soft defect localization (SDL) is an established fault isolation process for localizing soft defects using laser heating. This paper consolidates interesting analysis cases to identify good relation between SDL set-points and defect types that enables better approach in exposing such defects during physical analysis and reduce cause-not-founds.
Keywords :
fault diagnosis; fault location; integrated circuit reliability; laser beam applications; cause-not-founds; fault isolation process; integrated circuits; laser heating; soft defect localization set-points; Circuit faults; Circuit testing; Failure analysis; Hardware; Heating; Integrated circuit interconnections; Laser theory; Optical imaging; Optical microscopy; Temperature sensors;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2039-1
Electronic_ISBN :
978-1-4244-2040-7
DOI :
10.1109/IPFA.2008.4588203
