DocumentCode
2410332
Title
Understanding Soft Defect Localization set-points for reducing cause-not-founds in integrated circuits
Author
Ravikumar, V.K. ; Phoa, S.L. ; Narang, V. ; Chin, J.M.
Author_Institution
Adv. Micro Devices Singapore Pte Ltd., Singapore
fYear
2008
fDate
7-11 July 2008
Firstpage
1
Lastpage
4
Abstract
Soft defect localization (SDL) is an established fault isolation process for localizing soft defects using laser heating. This paper consolidates interesting analysis cases to identify good relation between SDL set-points and defect types that enables better approach in exposing such defects during physical analysis and reduce cause-not-founds.
Keywords
fault diagnosis; fault location; integrated circuit reliability; laser beam applications; cause-not-founds; fault isolation process; integrated circuits; laser heating; soft defect localization set-points; Circuit faults; Circuit testing; Failure analysis; Hardware; Heating; Integrated circuit interconnections; Laser theory; Optical imaging; Optical microscopy; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the
Conference_Location
Singapore
Print_ISBN
978-1-4244-2039-1
Electronic_ISBN
978-1-4244-2040-7
Type
conf
DOI
10.1109/IPFA.2008.4588203
Filename
4588203
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