Title :
2005 IEEE Radiation Effects Data Workshop (IEEE Cat. No. 05TH8835)
Abstract :
The following topics are dealt with: total ionizing dose; displacement damage and single particle effects on a large number of electronic devices, integrated circuits and detectors; hardness-by-design methodologies and environments and facilities.
Keywords :
integrated circuit testing; radiation effects; radiation hardening (electronics); detector devices; displacement damage; electronic devices; hardness-by-design methodologies; integrated circuits; radiation effects; single particle effects; total ionizing dose;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532652
