• DocumentCode
    2410590
  • Title

    Single event transients in operational amplifiers

  • Author

    George, J. ; Koga, R. ; Crain, S. ; Yu, P. ; Nguyen, S. ; Normandy, E. ; Kachuche, D. ; Steffan, B.K.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    8
  • Lastpage
    12
  • Abstract
    A number of bipolar operational amplifiers have been evaluated for single event effects for possible use in a space application. Various trigger thresholds were used to estimate the distribution of transient amplitudes.
  • Keywords
    bipolar transistor circuits; circuit testing; operational amplifiers; radiation effects; transients; bipolar operational amplifiers; radiation effects; single event effects; single event transients; transient amplitude distribution; Amplitude estimation; Circuit testing; Cyclotrons; Ion beams; Operational amplifiers; Oscilloscopes; Power amplifiers; Pulse amplifiers; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532658
  • Filename
    1532658
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410590