Title :
Single event transients in operational amplifiers
Author :
George, J. ; Koga, R. ; Crain, S. ; Yu, P. ; Nguyen, S. ; Normandy, E. ; Kachuche, D. ; Steffan, B.K.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
A number of bipolar operational amplifiers have been evaluated for single event effects for possible use in a space application. Various trigger thresholds were used to estimate the distribution of transient amplitudes.
Keywords :
bipolar transistor circuits; circuit testing; operational amplifiers; radiation effects; transients; bipolar operational amplifiers; radiation effects; single event effects; single event transients; transient amplitude distribution; Amplitude estimation; Circuit testing; Cyclotrons; Ion beams; Operational amplifiers; Oscilloscopes; Power amplifiers; Pulse amplifiers; Space technology; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532658
