Title :
Single event effects test and analysis results from the Boeing Radiation Effects Laboratory (BREL)
Author :
Wert, J.L. ; Normand, E. ; Oberg, D.L. ; Underwood, D.C. ; Vallejo, M. ; Kouba, C. ; Page, T.E. ; Perry, W.M.
Author_Institution :
Boeing Co., Seattle, WA, USA
Abstract :
We describe the results of single event effects testing conducted by the Boeing Radiation Effects Laboratory on a variety of devices. The data include SEU, SEL and SEFI cross sections induced by both heavy ions and protons.
Keywords :
proton effects; semiconductor device testing; Boeing Radiation Effects Laboratory; SEFI cross sections; SEL cross sections; SEU cross sections; heavy ion effects; proton effects; single event effects testing; Aerospace testing; EPROM; Electronic equipment testing; Laboratories; Nondestructive testing; PROM; Performance evaluation; Radiation effects; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532659
