Title :
Test results of single-event effects conducted by the Jet Propulsion Laboratory
Author :
Trom, F. ; Miyahira, Tetsuo F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports recent single-event effects results for a variety of microelectronic devices that include ADC, DAC, DDS, MOSFET driver, analog switch, oscillator, and zero delay buffer. The data was collected to evaluate these devices for possible use in NASA spacecraft. Six of ten devices under study were sensitive to SEL, and the latchup was destructive.
Keywords :
CMOS integrated circuits; integrated circuit testing; radiation effects; space vehicle electronics; Jet Propulsion Laboratory; NASA spacecraft; destructive latchup; microelectronic devices; single-event effects; Delay effects; Laboratories; MOSFET circuits; Microelectronics; NASA; Oscillators; Propulsion; Space vehicles; Switches; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532662
