Title :
Single event upset characterization of the SMJ320C6701 digital signal processor using proton irradiation
Author :
Hiemstra, David M. ; Miladinovic, Bojan ; Chayab, Fayez
Author_Institution :
MDA Corp., Brampton, Ont., Canada
Abstract :
The proton induced SEU cross-section of the functional blocks of the SMJ320C6701 digital signal processor (DSP) are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.
Keywords :
digital signal processing chips; integrated circuit testing; proton effects; space vehicle electronics; SMJ320C6701 digital signal processor; proton induced SEU cross-section; proton irradiation effects; single event upset characterization; space radiation environment; upset rate estimation; Clocks; Digital signal processing; Digital signal processors; Logic devices; Logic testing; Protons; Random access memory; Single event upset; Space shuttles; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532663
