• DocumentCode
    2410703
  • Title

    Single event upset characterization of the SMJ320C6701 digital signal processor using proton irradiation

  • Author

    Hiemstra, David M. ; Miladinovic, Bojan ; Chayab, Fayez

  • Author_Institution
    MDA Corp., Brampton, Ont., Canada
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    42
  • Lastpage
    45
  • Abstract
    The proton induced SEU cross-section of the functional blocks of the SMJ320C6701 digital signal processor (DSP) are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.
  • Keywords
    digital signal processing chips; integrated circuit testing; proton effects; space vehicle electronics; SMJ320C6701 digital signal processor; proton induced SEU cross-section; proton irradiation effects; single event upset characterization; space radiation environment; upset rate estimation; Clocks; Digital signal processing; Digital signal processors; Logic devices; Logic testing; Protons; Random access memory; Single event upset; Space shuttles; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532663
  • Filename
    1532663
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410703