Part II. Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation

The proton induced dynamic SEU cross-section of additional functional blocks and reference designs on the Virtex-II FPGA are presented. The measured reference design cross-sections are compared with calculated cross-sections based on their functional block utilization. The reference designs upset cross-sections are used to estimate their upset rate in the space radiation environment.