Title :
Dynamic single event upset characterization of the Virtex-IIPro´s embedded IBM PowerPC405 using proton irradiation
Author :
Chayab, Fayez ; Hiemstra, David M. ; Ronge, Roman
Author_Institution :
MDA Corp., Brampton, Ont., Canada
Abstract :
The proton induced dynamic SEU cross-section of the IBM PowerPC405 embedded in Xilinx´s Virtex-IIPro FPGAs is reported. This upset cross-section is then used to estimate upset rates in the space radiation environment.
Keywords :
IBM computers; SRAM chips; embedded systems; field programmable gate arrays; integrated circuit testing; proton effects; SRAM chips; Virtex-IIPro FPGA system; Virtex-IIPro embedded IBM PowerPC405; dynamic single event upset characterization; field programmable gate arrays; proton induced dynamic SEU cross-section; proton irradiation effects; space radiation environment; upset rate estimation; Application software; Field programmable gate arrays; Hardware; Logic; Particle beams; Protons; Random access memory; Single event upset; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532665
