Title :
Heavy ion and proton see characterization of COTS 0.22μm field programmable gate arrays
Author :
Koga, R. ; Crawford, K. ; Yu, P. ; George, J. ; Crain, S. ; Zakrzewski, M. ; Wang, J.J.
Author_Institution :
Aerosp. Corp., El Segundo, CA
Abstract :
Single event effect vulnerabilities of currently available commercial-off-the-shelf (COTS) field programmable gate arrays (FPGAs) have been measured. They are compared with those observed in older COTS devices as well as with some radiation hardened devices
Keywords :
field programmable gate arrays; integrated circuit testing; proton effects; 0.22 micron; commercial-off-the-shelf field programmable gate arrays; heavy ion SEE characterization; proton SEE characterization; radiation effects; single event effect vulnerability; single event effects; Clocks; Counting circuits; Field programmable gate arrays; Foundries; Frequency; Protons; Radiation hardening; Shift registers; Space technology; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532666
