• DocumentCode
    2410783
  • Title

    Single event upset characterization of the ESP603 single board space computer with the PowerPC603r processor using proton irradiation

  • Author

    Rufenacht, Hermann ; Hiemstra, David M. ; Ronge, Roman ; Klincsek, Tom ; Le, Kim Anh ; Gazdewich, Jerome

  • Author_Institution
    EMS Technol. Canada Ltd., St. Anne de Bellevue, Que., Canada
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    65
  • Lastpage
    69
  • Abstract
    The proton induced SEU cross-sections measured in a dynamic test of the ESP603 Power PC 603r processor are presented. The cross-sections are used to estimate upset rates in the space radiation environment.
  • Keywords
    integrated circuit testing; microcomputers; microprocessor chips; proton effects; space vehicle electronics; ESP603 single board space computer; PowerPC603r processor; proton induced SEU cross-sections; proton irradiation effects; single event upset characterization; space radiation environment; upset rate estimation; Application software; Circuit testing; Computerized monitoring; Control systems; Low earth orbit satellites; Medical services; Protons; Single event upset; Software testing; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2005. IEEE
  • Print_ISBN
    0-7803-9367-8
  • Type

    conf

  • DOI
    10.1109/REDW.2005.1532668
  • Filename
    1532668
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2410783