Radiation hardness evaluation of a class V 32-bit floating-point digital signal processor

Author

Joshi, R. ; Daniels, R. ; Shoga, M. ; Gauthier, M.

Author_Institution

Texas Instruments Inc., Dallas, TX, USA

fYear

2005

fDate

11-15 July 2005

Firstpage

70

Lastpage

78

Abstract

The single event effects (SEE) and total ionizing dose (TID) test results of SMV320C6701, a 32-bit, floating-point digital signal processor (DSP) from Texas Instruments (TI) are reported in this paper. The DSP was tested for SEE using heavy ions and high energy neutrons. Effects characterized include single event upsets (SEU) and single event latch-up (SEL). Additional effects such as functional interrupts and transients are also discussed. Finally, the proton SEU rates extrapolated from the heavy ion SEU rates are presented.

Keywords

digital signal processing chips; integrated circuit testing; neutron effects; proton effects; 32 bit; SMV320C6701 floating-point digital signal processor; class V floating-point digital signal processor; functional interrupts; heavy ion SEU rates; heavy ions; high energy neutrons; proton SEU rates; radiation hardness evaluation; single event effects; single event latch-up; single event upsets; total ionizing dose; Clocks; Data processing; Digital signal processing; Digital signal processors; Instruments; Random access memory; Registers; Single event upset; Testing; VLIW;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2005. IEEE

Print_ISBN

0-7803-9367-8

Type

conf

DOI

10.1109/REDW.2005.1532669

Filename

1532669