Validation and testing of design hardening for single event effects using the 8051 microcontroller

Author

Howard, James W., Jr. ; LaBel, Kenneth A. ; Carts, Martin A. ; Seidleck, Christina ; Gambles, Jody W. ; Ruggles, Steven L.

Author_Institution

NASA-GSFC, Greenbelt, MD, USA

fYear

2005

fDate

11-15 July 2005

Firstpage

85

Lastpage

92

Abstract

With the dearth of dedicated radiation hardened foundries, new and novel techniques are being developed for hardening designs using nondedicated foundry services. In this paper, we discuss the implications of validating these methods for the single event effects (SEE) in the space environment. Topics include the types of tests that are required and the design coverage (i.e., design libraries: do they need validating for each application?). Finally, an 8051 microcontroller core from NASA Institute of Advanced Microelectronics (IAμE) CMOS ultra low power radiation tolerant (CULPRiT) design is evaluated for SEE mitigative techniques against two commercial 8051 devices.

Keywords

CMOS digital integrated circuits; integrated circuit design; integrated circuit testing; low-power electronics; microcontrollers; radiation effects; space vehicle electronics; 8051 microcontrollers; CMOS ultra low power radiation tolerant design; SEE mitigative techniques; nondedicated foundry services; radiation effects; radiation hardening; single event effects; space environment; Design engineering; Foundries; Libraries; Microcontrollers; Microelectronics; NASA; Qualifications; Radiation hardening; Space technology; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2005. IEEE

Print_ISBN

0-7803-9367-8

Type

conf

DOI

10.1109/REDW.2005.1532671

Filename

1532671