Title :
SEE and TID results for a commercially fabricated radiation-hardened clock generator circuit
Author :
Hafer, C. ; Schnathorst, V. ; Pfeil, J. ; Meade, T. ; Farris, T. ; Jordan, A.
Author_Institution :
Aeroflex Colorado Springs, CO, USA
Abstract :
A RadHard-by-design, PLL-based, single chip, clock network and clock generator solution has been designed, manufactured and tested. Hardness test results for the Aeroflex Colorado Springs RadClock™ clock generator circuit designed for harsh space environment applications are presented.
Keywords :
CMOS digital integrated circuits; clocks; integrated circuit testing; phase locked loops; radiation effects; RadClock clock generator circuit; RadHard-by-design clock generator; harsh space environment; radiation-hardened clock generator circuit; single chip PLL-based clock generator; single chip PLL-based clock network; CMOS process; Circuit testing; Clocks; Flip-flops; Frequency; Jitter; Manufacturing; Monolithic integrated circuits; Phase locked loops; Springs;
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
DOI :
10.1109/REDW.2005.1532672
