DocumentCode :
2411035
Title :
Compendia of radiation test results of integrated circuits
Author :
Layton, Phil ; Patnaude, Ed ; Williamson, Gale ; Longden, Larry ; Sloan, Clancy
Author_Institution :
Maxwell Technol. Inc., San Diego, CA, USA
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
156
Lastpage :
162
Abstract :
Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Keywords :
integrated circuit testing; radiation effects; integrated circuit testing; radiation effects; radiation reliability data; radiation testing; single event effects; space environment; space products; total ionizing dose; Circuit testing; Cyclotrons; EPROM; Gold; Integrated circuit testing; Ionizing radiation; Logic; Performance evaluation; Single event upset; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN :
0-7803-9367-8
Type :
conf
DOI :
10.1109/REDW.2005.1532683
Filename :
1532683
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2411035
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