DocumentCode
2411064
Title
Total ionizing dose gamma and proton radiation testing on a COTS interline CCD with microlens
Author
Lee, P.P.K. ; Thompson, D.A. ; Modney, D.L.
Author_Institution
ITT Industries Space Syst. Div., Rochester, NY, USA
fYear
2005
fDate
11-15 July 2005
Firstpage
163
Lastpage
169
Abstract
Commercially fabricated interline CCDs were total ionizing dose (TID) tested with gamma (γ) and proton (p+) radiation. Materials used for microlenses applied to the array surface were also irradiated on fused silica substrates. Device and material performance degradations are presented.
Keywords
charge-coupled devices; gamma-ray effects; microlenses; proton effects; semiconductor device testing; COTS interline CCD; amplifier gain; charge transfer efficiency; dark current; fused silica substrates; gamma radiation testing; microlens materials; photodiode devices; proton radiation testing; quantum efficiency; total ionizing dose; Buffer layers; Charge coupled devices; Diodes; Ionizing radiation; Lenses; Microoptics; Photodiodes; Protons; Sensor arrays; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2005. IEEE
Print_ISBN
0-7803-9367-8
Type
conf
DOI
10.1109/REDW.2005.1532684
Filename
1532684
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