Title :
Low-cost software-based self-testing of RISC processor cores
Author :
Kranitis, N. ; Xenoulis, G. ; Gizopoulos, D. ; Paschalis, A. ; Zorian, Y.
Author_Institution :
Dept. of Informatics & Telecom, Athens Univ., Greece
Abstract :
Software self-testing of embedded processor cores which effectively partitions the testing effort between low-speed external equipment and internal processor resources, has been recently proposed as an alternative to classical hardware built-in self-lest techniques over which it provides significant advantages. In this paper we present a low-cost software-based self-testing methodology for processor cores with the aim of producing compact test code sequences developed with a limited engineering effort and achieving a high fault coverage for the processor core. The objective of small test code sequences is directly related to the utilization of low-speed external testers since test time is primarily determined by the time required to download the lest code to the processor memory at the tester´s low frequency. Successful application of the methodology to a RISC processor core architecture with a 3-stage pipeline is demonstrated.
Keywords :
built-in self test; embedded systems; fault diagnosis; microprocessor chips; pipeline processing; reduced instruction set computing; 3-stage pipeline; RISC processor cores; embedded cores; fault coverage; internal processor resources; low speed external equipment; low-speed external testers; software-based self-testing; test code sequences; Automatic testing; Built-in self-test; Costs; Frequency; Hardware; Informatics; Logic testing; Memory; Reduced instruction set computing; Software testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253691