DocumentCode :
2411353
Title :
CMOS varactors in NLTL pulse-compression applications
Author :
Li, Ming ; Harrison, Robert G. ; Amaya, Rony E. ; Duchamp, Jean-Marc ; Ferrari, Philippe ; Tarr, N. Garry
Author_Institution :
Carleton Univ., Ottawa
fYear :
2007
fDate :
9-12 Oct. 2007
Firstpage :
1405
Lastpage :
1408
Abstract :
This paper discusses the feasibility of using CMOS varactors in designing all-silicon pulse-compression nonlinear transmission lines (NLTLs). Six different varactor structures based on CMOS transistors are investigated, and are divided into two groups. One group, with a monotonic C(V) characteristic, can be used in single-edge pulse-compression NLTLs, while the other, having a non-monotonic C(V), is suited for double-edge pulse-compression. After simulation and evaluation of the Cmax/Cmin ratios and cutoff frequencies of the six structures, two types of NMOS varactors for use in NLTL designs were fabricated in a CMOS 0.18-mum process. On-chip measurements were made. Transient simulations based on these measurements show a leading edge rise time reduction of 75% for single-edge, and 60% for double-edge pulse sharpening.
Keywords :
CMOS integrated circuits; nonlinear network synthesis; pulse compression; transmission lines; varactors; CMOS process; CMOS transistors; CMOS varactors; NLTL; NMOS varactors; double-edge pulse sharpening; double-edge pulse-compression; monotonic characteristic; nonlinear transmission lines; on-chip measurements; single-edge pulse sharpening; single-edge pulse-compression; size 0.18 mum; CMOS process; CMOS technology; Cutoff frequency; Doping; MOS devices; Power system transients; Pulse measurements; Radio frequency; Transmission lines; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2007. European
Conference_Location :
Munich
Print_ISBN :
978-2-87487-001-9
Type :
conf
DOI :
10.1109/EUMC.2007.4405467
Filename :
4405467
Link To Document :
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