DocumentCode :
2411475
Title :
Exploring high bandwidth pipelined cache architecture for scaled technology
Author :
Agarwal, Amit ; Roy, Kaushik ; Vijaykumar, T.N.
Author_Institution :
Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2003
fDate :
2003
Firstpage :
778
Lastpage :
783
Abstract :
In this paper, we propose a design technique to pipeline cache memories for high bandwidth applications. With the scaling of technology, cache access latencies are multiple clock cycles. The proposed pipelined cache architecture can be accessed every clock cycle and, thereby, enhances bandwidth and overall processor performance. The proposed architecture utilizes the idea of banking to reduce bit-line and word-line delay, making word-line to sense amplifier delay fit into a single clock cycle. Experimental results show that optimal banking allows the cache to be split into multiple stages whose delays are equal to the clock cycle time. The proposed design is fully scalable and can be applied to future technology generations. Power, delay and area estimates show that on average, the proposed pipelined cache improves MOPS (millions of operations per unit time per unit area per unit energy) by 40-50% compared to current cache architectures.
Keywords :
cache storage; integrated circuit design; logic design; logic simulation; pipeline processing; MOPS improvement; banking; bit-line delay; cache access latency; cache access time reduction; high bandwidth architecture; pipelined cache architecture; processor performance enhancement; scaled technology cache; single clock cycle access; word-line/sense amplifier delay; Bandwidth; Banking; CMOS technology; Clocks; Computer architecture; Decoding; Delay effects; Delay estimation; Pipeline processing; Surface-mount technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253701
Filename :
1253701
Link To Document :
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