The effect of Radon on soft error rates for wire bonded memories

Soft errors caused by different high energetic radiation particles, such as alpha, neutron, thermal neutron, proton, and heavy ions are well studied and understood. But few studies have been complete on effect of Radon on IC components soft error. Complicating matters, Radon a naturally occurring radioactive gas could diffuse into and through the different IC package materials and emit alpha particles as the gas atom and its progeny decay. While the diffusion constant and solubility of Radon in these materials are not well known, these decays could cause soft errors if they occur in regions near sensitive component nodes. Furthermore, different geographic location has different concentration of Radon. If Radon contributes to IC components soft error, its affect should be quantified. This paper reports the soft error test result in an accelerated Radon ambient and concludes Radon impact on soft errors.