• DocumentCode
    2412255
  • Title

    Transistor-level static timing analysis by piecewise quadratic waveform matching

  • Author

    Wang, Zhong ; Zhu, Jianwen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1026
  • Lastpage
    1031
  • Abstract
    While fast timing analysis methods, such as asymptotic waveform evaluation (AWE), have been well established for linear circuits, the timing analysis for non-linear circuits, which are dominant in digital CMOS circuits, is usually, performed by a SPICE like, time domain integration based approach, involving expensive Newton Raphson iterations at numerous time steps. In this paper we propose a new technique that leads to the transient solution of charge/discharge paths with a complexity equivalent to only K DC operating point calculations, where K is the number of transistors along the path. This is accomplished by approximating each nodal voltage as a piecewise quadratic waveform, whose characteristics can be determined by matching the charge/discharge currents. Experiments on a wide range of circuits show that a 31.6 times speed-up over SPICE transient simulation with 10 ps step size can be achieved, while maintaining an average accuracy of 99%.
  • Keywords
    CMOS digital integrated circuits; Newton-Raphson method; VLSI; circuit analysis computing; nonlinear network analysis; timing; transient analysis; DC operating point calculations; Newton Raphson iterations; charge/discharge paths; digital CMOS circuits; nodal voltage approximation; nonlinear circuits; piecewise quadratic waveform matching; transient solution; transistor-level static timing analysis; CMOS digital integrated circuits; Circuit analysis; Circuit simulation; Linear circuits; Performance analysis; Performance evaluation; SPICE; Time domain analysis; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253739
  • Filename
    1253739