• DocumentCode
    2412265
  • Title

    A fast algorithm for the layout based electro-thermal simulation

  • Author

    Rencz, M. ; Székely, V. ; Poppe, A.

  • Author_Institution
    Budapest Univ. of Technol. & Econ., Hungary
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1032
  • Lastpage
    1037
  • Abstract
    A new algorithm has been developed for the layout based direct electro-thermal simulation of integrated circuits. The advantage of the direct electro-thermal simulation over simulator coupling is, that very fast changes can also be considered, the drawback is that the thermal nodes are added to the number of nodes of the network to be simulated. The novelties of our method are the modeling and the solution of the thermal structure. This paper presents the algorithm of the time constant spectrum based FOSTER chain matrix thermal modeling, and the new algorithm of the coupled electro-thermal solution, where parts of the network, which represent the thermal behavior, are not computed in all steps of the iteration. This speeded up algorithm works both in the time-, and in the frequency domain. A simulation example demonstrates a typical application: the prediction of how the layout arrangement and the packaging of an analogue integrated circuit influence the electrical parameters.
  • Keywords
    VLSI; analogue integrated circuits; circuit simulation; impedance matrix; integrated circuit layout; integrated circuit modelling; integrated circuit packaging; thermal analysis; analogue ICs; coupled electro-thermal solution; electrical parameters; fast algorithm; integrated circuits; layout based electro-thermal simulation; spectrum based FOSTER chain matrix thermal modeling; thermal nodes; time constant thermal modeling; Analog integrated circuits; Circuit simulation; Computational modeling; Computer networks; Coupling circuits; Frequency domain analysis; Integrated circuit layout; Integrated circuit modeling; Integrated circuit packaging; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253740
  • Filename
    1253740