• DocumentCode
    2412340
  • Title

    Reducing power consumption for high-associativity data caches in embedded processors

  • Author

    Nicolaescu, Dan ; Veidenbaum, Alex ; Nicolau, Alex

  • Author_Institution
    Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1064
  • Lastpage
    1068
  • Abstract
    Modern embedded processors use data caches with higher and higher degrees of associativity in order to increase performance. A set-associative data cache consumes a significant fraction of the total power budget in such embedded processors. This paper describes a technique for reducing the D-cache power consumption and shows its impact on power and performance of an embedded processor. The technique utilizes cache line address locality to determine (rather than predict) the cache way prior to the cache access. It thus allows only the desired way to be accessed for both tags and data. The proposed mechanism is shown to reduce the average L1 data cache power consumption when running the MiBench embedded benchmark suite for 8, 16 and 32-way set-associate caches by, respectively, an average of 66%, 72% and 76%. The absolute power savings from this technique increase significantly with associativity. The design has no impact on performance and, given that it does not have mis-prediction penalties, it does not introduce any new non-deterministic behavior in program execution.
  • Keywords
    cache storage; embedded systems; logic design; logic simulation; low-power electronics; microprocessor chips; D-cache; L1 data cache; cache access; cache associativity; cache line address locality; cache way determination; data access; embedded processors; high-associativity data caches; power consumption reduction; set-associative data cache; tag access; Computer science; Delay; Energy consumption; Europe; Hardware; Instruction sets; Logic; System performance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253745
  • Filename
    1253745