Title :
Stochastic models of quality in continuous information systems
Author :
Eidukas, Danielius ; Kalnius, Rimantas
Author_Institution :
Dept. of Electron. Eng., Kaunas Univ. of Technol., Kaunas
Abstract :
Mathematical models of main stochastic characteristics of continuous multistage inter-operational control for the IS of mechatronics were created, when the flows of rejected IS are returned to the manufacture process for regeneration, and IS classification rules are analogous at the separate control stages, and when undeniable IS classification errors of the first and second kind are present. The efficiency of control operation is estimated in the way of modeling according to transformations of density functions of defectivity level at separate stages, by applying beta distribution and dynamics of defectivity level mean variation. It was shown that returning flows are determined by error probabilities and the level of defectivity before control, and the models of separate stages differ only in the magnitude of generalized error, which equals the product of generalized error probabilities of separate stages. Manufacturing peculiarities of IS and their components were employed during creation of models.
Keywords :
continuous systems; engineering information systems; error statistics; manufacturing data processing; mechatronics; pattern classification; process control; quality control; stochastic processes; IS classification rules; continuous information systems; continuous multistage inter-operational control; error probabilities; mechatronics; quality stochastic models; regeneration manufacture process; Density functional theory; Error correction; Error probability; Information systems; Manufacturing processes; Mathematical model; Mechatronics; Stochastic processes; Stochastic systems; Virtual manufacturing; IS; Information systems; beta-distribution; efficiency; models; quality;
Conference_Titel :
Information Technology Interfaces, 2008. ITI 2008. 30th International Conference on
Conference_Location :
Dubrovnik
Print_ISBN :
978-953-7138-12-7
Electronic_ISBN :
1330-1012
DOI :
10.1109/ITI.2008.4588497