DocumentCode :
2413014
Title :
Non-intrusive concurrent error detection in FSMs through state/output compaction and monitoring via parity trees
Author :
Drineas, Petros ; Makris, Yiorgos
Author_Institution :
Departments of CS & EE, Yale Univ., New Haven, CT, USA
fYear :
2003
fDate :
2003
Firstpage :
1164
Lastpage :
1165
Abstract :
We discuss a non-intrusive methodology for concurrent error detection in FSMs. The proposed method is based on compaction and monitoring of the state/output bits of an FSM via parity trees. While errors may affect more than one state/output bit, not all combinations of state/output bits constitute potential erroneous cases for a given fault model. Therefore, it is possible to compact them without loss of error information. Thus, concurrent error detection is performed through hardware that predicts the values of the compacted state/output bits and compares them to the actual values of the FSM. In order to minimize the incurred hardware overhead, a randomized algorithm is proposed for selecting the minimum number of required parity functions.
Keywords :
condition monitoring; error detection; finite state machines; FSM; nonintrusive concurrent error detection; parity functions; parity trees; randomized algorithm; state/output bits compaction; state/output bits monitoring; Circuit faults; Clocks; Compaction; Delay; Electrical fault detection; Fault detection; Hardware; Linear programming; Logic; Monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN :
1530-1591
Print_ISBN :
0-7695-1870-2
Type :
conf
DOI :
10.1109/DATE.2003.1253783
Filename :
1253783
Link To Document :
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