Abstract :
The following topics are dealt with: 3D and SiP; extreme SRAMs; compact models for advanced CMOS technologies; oversampling A/D converters; advances in programmable devices; emerging wireless applications; microsystems for biomedical applications; test, characterization and jitter of high-speed serial I/O and clocks; biomedical sensors; Nyquist A/D converters; clocking and CDRs; power management techniques; CMOS scaling and technology implications; signal and data processing; wideband techniques; compact modeling for analog and RF; front-ends and synthesizers for communication applications; analog techniques; high-performance processors and digital techniques; mm-wave systems and building blocks; process variability mitigation; advanced memories; advanced oscillator concepts; imagers and MEMS; substrate noise modeling and behavioral models.
Keywords :
CMOS integrated circuits; MMIC; SRAM chips; analogue-digital conversion; bioMEMS; biosensors; clocks; integrated circuit modelling; microprocessor chips; oscillators; signal processing; system-in-package; CDR; CMOS scaling; MEMS; Nyquist A/D converters; SiP; advanced CMOS technologies; advanced memories; advanced oscillator; analog techniques; behavioral models; biomedical microsystems; biomedical sensors; clocking; clocks; communication front-ends; communication synthesizers; compact modeling; compact models; data processing; digital techniques; emerging wireless applications; extreme SRAM; high-performance processors; high-speed serial I/O; imagers; mm-wave systems; oversampling A/D converters; power management; process variability mitigation; programmable devices; signal processing; substrate noise modeling; technology implications; wideband techniques;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-0786-6
DOI :
10.1109/CICC.2007.4405668
