Title :
Polychrony for refinement-based design [high-level synthesis]
Author :
Talpin, Jean-Pierre ; Guernic, Paul Le ; Shukla, Sandeep KUmar ; Gupta, Rajesh ; Doucet, Frédéric
Author_Institution :
IRISA, INRIA, Sophia Antipolis, France
Abstract :
System design based on the so-called "synchronous hypothesis" consists of abstracting the nonfunctional implementation details of a system away and let one benefit from a focused reasoning on the logics behind the instants at which the system functionalities should be secured. From this point of view, synchronous design models and languages provide intuitive models for integrated circuits. This affinity explains the ease of generating synchronous circuits and verify their functionalities using compilers and related tools that implement this approach. In the relational model of the SIGNAL/POLYCHRONY design language/platform this affinity goes beyond the domain of purely synchronous circuits to embrace the context of architectures consisting of synchronous circuits and desynchronization protocols: GALS architectures. The unique features of this model are to provide the notion of polychrony: the capability to describe multiclocked (or partially clocked) circuits and systems; and to support formal design refinement, from the early stages of requirements specification, to the later stages of synthesis and deployment, and by using formal verification techniques.
Keywords :
asynchronous circuits; clocks; formal specification; formal verification; high level synthesis; GALS architectures; SIGNAL/POLYCHRONY design language/platform; asynchronous system; desynchronization protocols; formal design refinement; formal verification; hardware-software co-design; high-level synthesis; integrated circuit intuitive models; multiclocked circuits; partially clocked circuits; relational modeling; requirements specification; synchronous design models; synchronous hypothesis; system design; Circuit synthesis; Circuits and systems; Clocks; Context modeling; High level synthesis; Integrated circuit modeling; Logic design; Protocols; Signal design; Synchronous generators;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253786