• DocumentCode
    2413120
  • Title

    Automatic generation of simulation monitors from quantitative constraint formula [system-level verification]

  • Author

    Chen, Xi ; Hsieh, Harry ; Balarin, Felice ; Watanabe, Yosinori

  • Author_Institution
    Univ. of California, Riverside, CA, USA
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    1174
  • Lastpage
    1175
  • Abstract
    System design methodology is poised to become the next big enabler for highly sophisticated electronic products. Design verification continues to be a major challenge and simulation will remain an important tool for making sure that implementations perform as they should. In this paper we present algorithms to automatically generate C++ checkers from any formula written in the formal quantitative constraint language, logic of constraints (LOC). The executable can then be used to analyze the simulation traces for constraint violation and output debugging information. Different checkers can be generated for fast analysis under different memory limitations. LOC is particularly suitable for specification of system level quantitative constraints where relative coordination of instances of events, not lower level interaction, is of paramount concern. We illustrate the usefulness and efficiency of our automatic trace analysis methodology with case studies on large simulation traces from various system level designs.
  • Keywords
    C++ language; constraint handling; embedded systems; formal specification; formal verification; logic design; logic simulation; C++ checkers; LOC; automatic simulation monitor generation; automatic trace analysis; constraint violation; embedded systems; event instances relative coordination; formal quantitative constraint language; logic of constraints; output debugging; quantitative constraint formula; system level specification; system-level verification; Analytical models; Automatic logic units; Consumer electronics; Debugging; Information analysis; Lab-on-a-chip; Laboratories; Logic design; Product design; System-level design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253787
  • Filename
    1253787