Title :
Flex-Pass-Gate SRAM Design for Static Noise Margin Enhancement Using FinFET-Based Technology
Author :
O´uchi, S. ; Masahara, M. ; Sakamoto, K. ; Endo, K. ; Liu, Y.X. ; Matsukawa, T. ; Sekigawa, T. ; Koike, H. ; Suzuki, E.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba
Abstract :
We propose a flex-pass-gate SRAM (Flex-PG SRAM), i.e., a FinFET-based SRAM to enhance both the read and write static noise margins (SNMs) independently. The flip-flop in the Flex-PG SRAM consists of usual FinFETs while its pass gates consist of double-"independent"-gate FinFETs, four-terminal-FinFETs. A TCAD simulation revealed that the Flex-PG SRAM increases the read SNM by 70 mV even when its 6-sigma tolerance is ensured, without the cell size penalty and decrease in the write SNM.
Keywords :
MOSFET circuits; SRAM chips; FinFET-based technology; flex-pass-gate SRAM design; flip-flop; static noise margin enhancement; Circuit noise; FinFETs; Flexible printed circuits; Nanoelectronics; Random access memory; Stability; Threshold voltage; Timing; Variable structure systems; Voltage control;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405676