Title :
Robust segmentation for automatic detection of mura patterns
Author :
Shao, Hao-Chiang ; Jong, Tai-Lang ; Chen, Yung-Chang ; Chang, Wei-Cheng ; Lan, Yu-Ping
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing-Hua Univ., Hsinchu, Taiwan
Abstract :
We propose a simple, straightforward, and efficient method to segment the mura patterns from an input image. Since mura patterns are locally non-uniform variations and the input images are low-contrast ones, the proposed method is prepared against both global and local high-frequency components. Performance of the proposed method is evaluated on real LCD images.
Keywords :
image denoising; image enhancement; image segmentation; LCD; automatic detection; image enhancement; image segmentation; mura patterns; robust segmentation; wavelet denoising; Humans; Image enhancement; Image segmentation; Inspection; Measurement standards; Noise reduction; Pattern analysis; Phase noise; Robustness; Visual system; LCD; Mura defect; image enhancement; segmentation; soft-thresholding; wavelet denoising;
Conference_Titel :
Consumer Electronics, 2009. ISCE '09. IEEE 13th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-2975-2
Electronic_ISBN :
978-1-4244-2976-9
DOI :
10.1109/ISCE.2009.5156837